Prof. R. Eng. Dalia Abdel Salam Al-Faqi
Summary of project:
The radiation environment in space may cause individual effects on satellite electronics. The occurrence of single events (SEUs) in analog devices has caused mutations in several spacecraft. A single event impact system using a picosecond pulse laser was implemented in Egypt to simulate the single event impact generated by heavy space ions. The advantage of the system is that tests can be performed without To a long wait and a limited time frame, in addition to the possibility of repetition in a safe environment.
This research aims to obtain a two-dimensional scan of the electronic chip surface of the LM124 practical amplifier with the aim of drawing and characterizing sensitive points using a short-pulse laser system. In this paper, the effect of a single event was determined in the LM124 practical amplifier. The practical amplifier can be deformed as a result of focusing high-energy light pulses. A sensitive map was drawn after a complete laser scan of the LM124 amplifier.
The objective of the project:
Study the effect of space rays on advanced components.
Developing test methods for the space environment.
Predicting the chronological lifespan of advanced electronics used on Earth in space.
Error rate calculation in advanced electronics.
The most important outputs:
A two-dimensional scan of the electronic chip surface of the LM124 practical amplifier in order to draw and characterize sensitive points.
Single Event Effect Identified in the LM124 Practical AmplifierThe practical amplifier can be distorted as a result of the focusing of high-energy light pulses.
A sensitivity map was drawn after a full laser scan of the LM124
Publish a search
A collection of images that express the outputs